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OverviewThis book is a concise but thorough introduction to the tools commonly used in pattern recognition and machine learning, including classification, dimensionality reduction, regression, and clustering, as well as recent popular topics such as deep neural networks and Gaussian process regression. The Second Edition is thoroughly revised, featuring a new chapter on the emerging topic of physics-informed machine learning and additional material on deep neural networks. Combining theory and practice, this book is suitable for the graduate or advanced undergraduate level classroom and self-study. It fills the need of a mathematically-rigorous text that is relevant to the practitioner as well, with datasets from applications in bioinformatics and materials informatics used throughout to illustrate the theory. These datasets are available from the book website to be used in end-of-chapter coding assignments based on python and Keras/Tensorflow. All plots in the text were generated using python scripts and jupyter notebooks, which can be downloaded from the book website. Full Product DetailsAuthor: Ulisses Braga-NetoPublisher: Springer International Publishing AG Imprint: Springer International Publishing AG Edition: Second Edition 2024 ISBN: 9783031609497ISBN 10: 3031609492 Pages: 400 Publication Date: 07 August 2024 Audience: Professional and scholarly , Professional & Vocational Format: Hardback Publisher's Status: Active Availability: Manufactured on demand ![]() We will order this item for you from a manufactured on demand supplier. Table of ContentsIntroduction.- Optimal Classification.- Sample-Based Classification.- Parametric Classification.- Nonparametric Classification.- Function-Approximation Classification.- Error Estimation for Classification.- Model Selection for Classification.- Dimensionality Reduction.- Clustering.- Regression.- Bayesian Machine Learning.- Scientific.- Machine Learning.- Appendices.ReviewsAuthor InformationUlisses Braga-Neto, Ph.D. is a Professor in the Department of Electrical and Computer Engineering at Texas A&M University. His main research areas are pattern recognition, machine learning, statistical signal processing, and applications in bioinformatics and materials informatics. He has worked extensively in the field of error estimation for pattern recognition and machine learning, having received an NSF CAREER award for research in this area, and co-authored a monograph with Edward R. Dougherty on the topic. He has also made contributions to the field of Mathematical morphology in signal and image processing. Tab Content 6Author Website:Countries AvailableAll regions |