Fundamentals of Crystallography, Powder X-ray Diffraction, and Transmission Electron Microscopy for Materials Scientists

Author:   Dong ZhiLi (Nanyang Technological University, Singapore)
Publisher:   Taylor & Francis Ltd
ISBN:  

9780367357948


Pages:   272
Publication Date:   24 May 2022
Format:   Hardback
Availability:   In Print   Availability explained
This item will be ordered in for you from one of our suppliers. Upon receipt, we will promptly dispatch it out to you. For in store availability, please contact us.

Our Price $221.00 Quantity:  
Add to Cart

Share |

Fundamentals of Crystallography, Powder X-ray Diffraction, and Transmission Electron Microscopy for Materials Scientists


Add your own review!

Overview

Full Product Details

Author:   Dong ZhiLi (Nanyang Technological University, Singapore)
Publisher:   Taylor & Francis Ltd
Imprint:   CRC Press
Weight:   0.544kg
ISBN:  

9780367357948


ISBN 10:   0367357941
Pages:   272
Publication Date:   24 May 2022
Audience:   College/higher education ,  General/trade ,  Tertiary & Higher Education ,  General
Format:   Hardback
Publisher's Status:   Active
Availability:   In Print   Availability explained
This item will be ordered in for you from one of our suppliers. Upon receipt, we will promptly dispatch it out to you. For in store availability, please contact us.

Table of Contents

Part I: Introduction to Crystallography 1. Periodicity of Crystals and Bravais Lattices 2. Symmetry of Crystals, Point Groups and Space Groups 3. Reciprocal Lattice 4. Examples for Crystal Structure Representation Part Ii: X-ray Diffraction of Materials 5. Geometry of X-ray Diffraction 6. Intensity of Diffracted X-ray Beam 7. Experimental Methods and Powder X-ray Diffractometer 8. Rietveld Refinement of Powder X-ray Diffraction Patterns Part Iii: Transmission Electron Microscopy of Materials 9. Atomic Scattering Factors for Electrons and X-rays 10. Electron Diffraction in Transmission Electron Microscope 11. Diffraction Contrast 12. Phase Contrast

Reviews

Author Information

Dr. ZhiLi Dong received his B.Eng. degree in metallic materials engineering from Tsinghua University in 1984. Dong obtained his Ph.D. degree from Tsinghua University in 1989 under the Joint Ph.D. Program of the Ministry of Education of China. Dong received the Japanese Government Scholarship and carried out his PhD research at Osaka University in 1987 and 1988. Dong developed his research in the areas of materials engineering, synthesis of geo-mimetic materials, crystal structure/electronic structure-property relationships, and interface structure analysis. He has more than thirty years’ experience in x-ray diffraction and transmission electron microscopy of materials. Dong is an Associate Professor in the School of Materials Science & Engineering of Nanyang Technological University. Prior to joining NTU, Dong worked at the Environmental Technology Institute of Singapore as a senior research scientist, School of Mechanical and Production Engineering of NTU as a research fellow, University of Barcelona as a visiting professor, and Tsinghua University as a lecturer.

Tab Content 6

Author Website:  

Customer Reviews

Recent Reviews

No review item found!

Add your own review!

Countries Available

All regions
Latest Reading Guide

wl

Shopping Cart
Your cart is empty
Shopping cart
Mailing List