Fundamentals Of Atomic Force Microscopy - Part I: Foundations
Author:   Ronald G Reifenberger (Purdue Univ, Usa)
Publisher:   World Scientific Publishing Co Pte Ltd
Volume:   4
ISBN:  

9789814630351


Pages:   340
Publication Date:   12 November 2015
Format:   Paperback
Availability:   In Print   Availability explained
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Fundamentals Of Atomic Force Microscopy - Part I: Foundations


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Author:   Ronald G Reifenberger (Purdue Univ, Usa)
Publisher:   World Scientific Publishing Co Pte Ltd
Imprint:   World Scientific Publishing Co Pte Ltd
Volume:   4
Dimensions:   Width: 15.00cm , Height: 2.00cm , Length: 22.90cm
Weight:   0.476kg
ISBN:  

9789814630351


ISBN 10:   9814630357
Pages:   340
Publication Date:   12 November 2015
Audience:   College/higher education ,  Professional and scholarly ,  Postgraduate, Research & Scholarly ,  Professional & Vocational
Format:   Paperback
Publisher's Status:   Active
Availability:   In Print   Availability explained
This item will be ordered in for you from one of our suppliers. Upon receipt, we will promptly dispatch it out to you. For in store availability, please contact us.

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