Overview

Full Field Optical Metrology methods and techniques have been in existence since the first interferometry experiments by Thomas Young in the 19th Century. This book introduces non-contact optical techniques based on the speckle effect in more detail. It also covers surface metrology and explores other characteristics related to the surface, such as strain, stress, vibration, contouring, and its x, y, and z displacements (coupled as vectors in 2D and 3D). In addition, the book presents modern methods for phase retrieval, optical coherence tomography (OCT), and the moiré method. The book considers theoretical fundamentals and explores a number of applications for full-field optical metrology that are known to be widely used in many areas of interest such as biomedicine, quality control, remote sensing and probing, and manufacturing design. Scientists and Engineers looking for a reference book giving detailed work on methods/techniques in full-field speckle-based metrology are the key audiences for this text. Key Features Provides foundations on the classical subject of interferometry Pursues several applications for full-field optical metrology that are known to be widely used in many areas of interest, such as biomedicine, quality control, remote sensing and probing, and manufacturing design Includes a complete description of the methodology to perform 3D digital holographic/speckle interferometry and electron holography, both of which are not available in other texts

Full Product Details

9780750330251

Table of Contents

Reviews

Author Information

Manuel H. De la Torre I is a Research Professor with more than 15 years of experience in optical non-destructive testing applied to surface and internal inspections in engineering and biological studies. María del Socorro Hernández-Montes is a Research professor in the Division of Optical Metrology at the Center for Research in Optics (Centro de Investigaciones en Optica—CIO, México). Her research interests are mainly in Non-invasive and non-destructive optical methods and biomedical Optics. Jorge Mauricio Flores Moreno is a Research Professor at Optical Research Centre (CIO). He works in the microscopy areas using techniques like holography, confocal, multiphoton, and spectroscopy. Fernando Mendoza Santoyo is an Emeritus Professor at Centro de Investigaciones en Optica-CIO, México, where he was the founder of the Optical Metrology Division in 1991. He is a Fellow of OPTICA and SPIE.

Tab Content 6

Customer Reviews

Recent Reviews

Countries Available