Overview

This volume presents results in reliability theory. Topics covered include: Bayesian reliability; Bayesian reliability modelling; confounding in a series system; DF tests; Edgeworth approximation to reliability; estimation under random censoring; fault tree reduction for reliability; inference about changes in hazard rates; information theory and reliability; mixture experiment; mixture of Weibull distributions; queuing network approach in reliability theory; reliability estimation; reliability modelling; repairable systems; residual life function; software spare allocation systems; stochastic comparisons; stress-strength models; system-based component test plans; and TTT-transform.

Full Product Details

Author:   Asit P Basu (Univ Of Missouri-columbia, Usa) ,  Sujit K Basu (.) ,  Shyamaprasad Mukherjee (Univ College Of Sci, India) ,  Sujit K. Basu (Indian Institute of Management, India)
Publisher:   World Scientific Publishing Co Pte Ltd
Imprint:   World Scientific Publishing Co Pte Ltd
Volume:   4
Dimensions:   Width: 17.10cm , Height: 2.80cm , Length: 24.80cm
Weight:   0.885kg
ISBN:  

9789810233600

ISBN 10:   9810233604
Pages:   448
Publication Date:   03 August 1998
Audience:   Professional and scholarly ,  Professional & Vocational
Format:   Hardback
Publisher's Status:   Active
Availability:   Out of stock  
The supplier is temporarily out of stock of this item. It will be ordered for you on backorder and shipped when it becomes available.

Table of Contents

A Bayesian approach using nonhomogeneous poisson processes for software reliability models, J.A. Achcar et al; the class of life distributions that are Laplace order dominated by the exponential law and its ramifications, S.K. Basu and M. Mitra; on smoothed functional estimation under random censoring, Y.P. Chaubey and P.K. Sen; inference about sharp changes in hazard rates, J.K. Ghosh et al; stochastic comparisons of spacings and order statistics, S.C. Kochar; statistical approaches to modelling and estimating software reliability, T.K. Nayak; parameter estimation in software reliability growth models, L.D. Ries and A.P. Basu; role of stochastic orderings in spare allocation in systems, H. Singh; ordinary and Bayesian approach to life testing using the extreme value distribution, C.P. Tsokos; fault tree reduction for reliability analysis and improvement, M. Xie et al. (Part contents).

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