Fringe Pattern Analysis for Optical Metrology: Theory, Algorithms, and Applications
Author:   Manuel Servin (Centro de Investigaciones en) ,  J Antonio Quiroga ,  Moises Padilla
Publisher:   Wiley-Vch
ISBN:  

9781306840880


Pages:   345
Publication Date:   01 January 2014
Format:   Electronic book text
Availability:   Available To Order   Availability explained
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Fringe Pattern Analysis for Optical Metrology: Theory, Algorithms, and Applications


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Overview

The main objective of this book is to present the basic theoretical principles and practical applications for the classical interferometric techniques and the most advanced methods in the field of modern fringe pattern analysis applied to optical metrology. A major novelty of this work is the presentation of a unified theoretical framework based on the Fourier description of phase shifting interferometry using the Frequency Transfer Function (FTF) along with the theory of Stochastic Process for the straightforward analysis and synthesis of phase shifting algorithms with desired properties such as spectral response, detuning and signal-to-noise robustness, harmonic rejection, etc.

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Author:   Manuel Servin (Centro de Investigaciones en) ,  J Antonio Quiroga ,  Moises Padilla
Publisher:   Wiley-Vch
Imprint:   Wiley-Vch
ISBN:  

9781306840880


ISBN 10:   1306840880
Pages:   345
Publication Date:   01 January 2014
Audience:   General/trade ,  General
Format:   Electronic book text
Publisher's Status:   Active
Availability:   Available To Order   Availability explained
We have confirmation that this item is in stock with the supplier. It will be ordered in for you and dispatched immediately.

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