Overview
The main objective of this book is to present the basic theoretical principles and practical applications for the classical interferometric techniques and the most advanced methods in the field of modern fringe pattern analysis applied to optical metrology. A major novelty of this work is the presentation of a unified theoretical framework based on the Fourier description of phase shifting interferometry using the Frequency Transfer Function (FTF) along with the theory of Stochastic Process for the straightforward analysis and synthesis of phase shifting algorithms with desired properties such as spectral response, detuning and signal-to-noise robustness, harmonic rejection, etc.
Full Product Details
Author: Manuel Servin ,
J. Antonio Quiroga ,
Moises Padilla
Publisher: Wiley-VCH Verlag GmbH
Imprint: Blackwell Verlag GmbH
Dimensions:
Width: 17.50cm
, Height: 2.40cm
, Length: 25.10cm
Weight: 0.898kg
ISBN: 9783527411528
ISBN 10: 3527411526
Pages: 344
Publication Date: 02 July 2014
Audience:
Professional and scholarly
,
Professional & Vocational
Format: Hardback
Publisher's Status: Active
Availability: Out of stock
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Reviews
<p> I recommend this book for several reasons: it provides great insights into the principles and practical applications of classical and advanced interferometry in optical metrology, and it presents the main algorithms for recovering the modulating phase from single or multiple patterns. (Optics & Photonics, 8 October 2014)
I recommend this book for several reasons: it provides great insights into the principles and practical applications of classical and advanced interferometry in optical metrology, and it presents the main algorithms for recovering the modulating phase from single or multiple patterns. (Optics & Photonics, 8 October 2014)
I recommend this book for several reasons: it provides great insights into the principles and practical applications of classical and advanced interferometry in optical metrology, and it presents the main algorithms for recovering the modulating phase from single or multiple patterns. (Optics & Photonics, 8 October 2014)
<p> I recommend this book for several reasons: it providesgreat insights into the principles and practical applications ofclassical and advanced interferometry in optical metrology, and itpresents the main algorithms for recovering the modulating phasefrom single or multiple patterns. (Optics &Photonics, 8 October 2014)
Author Information
Manuel Servin received his engineering diploma from the École Nationale Supérieure des Télécommunications in France (1982), and his Ph.D. from the Centro de Investigaciones en �ptica A. C. (CIO) at Leon Mexico in 1994. He is co-author of the book `Interferogram Analysis for Optical Testing?. Dr. Servin has published more than 100 papers in scientific peer-reviewed journals on Digital Interferometry and Fringe Analysis. Juan Antonio Quiroga received his Ph.D. in physics in 1994 from the Universidad Complutense de Madrid, Spain. He is now teaching there at the Physics Faculty. His current principal areas of interest are Digital image processing applied to Optical Metrology and applied optics Moises Padilla is a Ph.D. student in optical sciences at the Centro de Investigaciones en �ptica (CIO) at León Mexico. He is associated with the optical metrology division of the CIO. His research activities are in digital signal processing and electrical communication engineering applied to processing and analysis of optical interferogram images.
