Formal Methods for Industrial Critical Systems: 19th International Conference, FMICS 2014, Florence, Italy, September 11-12, 2014, Proceedings

Author:   Frédéric Lang ,  Francesco Flammini
Publisher:   Springer International Publishing AG
Edition:   2014 ed.
Volume:   8718
ISBN:  

9783319107011


Pages:   201
Publication Date:   20 August 2014
Format:   Paperback
Availability:   Manufactured on demand   Availability explained
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Formal Methods for Industrial Critical Systems: 19th International Conference, FMICS 2014, Florence, Italy, September 11-12, 2014, Proceedings


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Author:   Frédéric Lang ,  Francesco Flammini
Publisher:   Springer International Publishing AG
Imprint:   Springer International Publishing AG
Edition:   2014 ed.
Volume:   8718
Dimensions:   Width: 15.50cm , Height: 1.20cm , Length: 23.50cm
Weight:   3.343kg
ISBN:  

9783319107011


ISBN 10:   3319107011
Pages:   201
Publication Date:   20 August 2014
Audience:   Professional and scholarly ,  Professional & Vocational
Format:   Paperback
Publisher's Status:   Active
Availability:   Manufactured on demand   Availability explained
We will order this item for you from a manufactured on demand supplier.

Table of Contents

Formal Verification of Steady-State Errors in Unity-Feedback Control Systems.- Assertion-Based Monitoring in Practice – Checking Correctness of an Automotive Sensor Interface.- Analysis of Real-Time Properties of a Digital Hydraulic Power Management System.- Formal Analysis of a Fault-Tolerant Routing Algorithm for a Network-on-Chip.- Formal Specification and Verification of TCP Extended with the Window Scale Option.- Learning Fragments of the TCP Network Protocol.- On the Validation of an Interlocking System by Model-Checking.- Deadlock Avoidance in Train Scheduling: A Model Checking Approach.- An Open Alternative for SMT-Based Verification of Scade Models.- Improving Static Analyses of C Programs with Conditional Predicates.- Detecting Consistencies and Inconsistencies of Pattern-Based Functional Requirements.- Test Specification Patterns for Automatic Generation of Test Sequences.- Randomised Testing of a Microprocessor Model Using SMT-Solver State Generation.

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