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OverviewThis guide provides extensive coverage of microscopic imaging principles. After reviewing the main principles of image formation, diffraction, interference, and polarization used in microscopy, this guide describes the most widely applied microscope configurations and applications. It also covers major system components, including light sources, illumination layouts, microscope optics, and image detection electronics. This guide also provides a comprehensive overview of microscopy techniques, including bright field and dark field imaging, contrast enhancement methods (such as phase and amplitude contrast), DIC, polarization, and fluorescence microscopy. In addition, it describes scanning techniques (such as confocal and multiphoton imaging points); new trends in super-resolution methods (such as 4Pi microscopy, STED, STORM, and structured illumination); and, array microscopy, CARS, and SPIM. Full Product DetailsAuthor: Tomasz S. TkaczykPublisher: SPIE Press Imprint: SPIE Press Volume: v. 13 Weight: 0.197kg ISBN: 9780819472465ISBN 10: 0819472468 Pages: 138 Publication Date: 30 June 2010 Audience: College/higher education , Professional and scholarly , Tertiary & Higher Education , Professional & Vocational Format: Spiral bound Publisher's Status: Active Availability: To order ![]() Stock availability from the supplier is unknown. We will order it for you and ship this item to you once it is received by us. Table of ContentsReviewsAuthor InformationTab Content 6Author Website:Countries AvailableAll regions |