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OverviewThis groundbreaking book provides you with a comprehensive understanding of FBAR (thin-film bulk acoustic wave resonator), MEMS (microelectomechanical system), and NEMS (nanoelectromechanical system) resonators. For the first time anywhere, you find extensive coverage of these devices at both the technology and application levels. This practical reference offers you guidance in design, fabrication, and characterization of FBARs, MEMS and NEBS. It discusses the integration of these devices with standard CMOS (complementary-metal-oxide-semiconductor) technologies, and their application to sensing and RF systems. Moreover, this one-stop resource looks at the main characteristics, differences, and limitations of FBAR, MEMS, and NEMS devices, helping you to choose the right approaches for your projects. Over 280 illustrations and more than 130 equations support key topics throughout the book. Full Product DetailsAuthor: Humberto CampanellaPublisher: Artech House Publishers Imprint: Artech House Publishers Edition: Unabridged edition Dimensions: Width: 18.30cm , Height: 2.30cm , Length: 25.90cm Weight: 0.816kg ISBN: 9781607839774ISBN 10: 1607839776 Pages: 360 Publication Date: 28 February 2010 Audience: Professional and scholarly , Professional & Vocational Format: Hardback Publisher's Status: Active Availability: In Print This item will be ordered in for you from one of our suppliers. Upon receipt, we will promptly dispatch it out to you. For in store availability, please contact us. Table of ContentsReviewsAuthor InformationThis groundbreaking book provides a comprehensive understanding of FBAR (thin-film bulk acoustic wave resonator), MEMS (microelectomechanical system), and NEMS (nanoelectromechanical system) resonators. For the first time anywhere, professionals find extensive coverage of these devices at both the technology and application levels. This practical reference offers guidance in design, fabrication, and characterization of FBARs, MEMS and NEBS. It discusses the integration of these devices with standard technologies, and their application to sensing and RF systems. Moreover, this one-stop resource looks at the main characteristics, differences, and limitations of FBAR, MEMS, and NEMS devices, helping practitioners to choose the right approaches for their projects. RF and microwave, telecommunications, material and process, and MEMS/NEMS engineers and scientists. Humberto Campanella is an associate professor at the Universitat Autonoma de Barcelona (UAB) and serves on the graduate research staff at the Centro Nacional de Microelectronica in Barcelona. He holds a Ph.D. in both electronics engineering and microelectronics and automated systems from Universitat Autonoma de Barcelona and the Universite Montpellier II in France, respectively. Tab Content 6Author Website:Countries AvailableAll regions |
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