Fault-Tracing: Against Quine-Duhem: A Defense of the Objectivity of Scientific Justification
Author:   Sam Mitchell
Publisher:   De Gruyter
ISBN:  

9783110996784


Pages:   232
Publication Date:   18 July 2022
Format:   Paperback
Availability:   Available To Order   Availability explained
We have confirmation that this item is in stock with the supplier. It will be ordered in for you and dispatched immediately.

Our Price $42.81 Quantity:  
Add to Cart

Share |

Fault-Tracing: Against Quine-Duhem: A Defense of the Objectivity of Scientific Justification


Add your own review!

Overview

Full Product Details

Author:   Sam Mitchell
Publisher:   De Gruyter
Imprint:   De Gruyter
Weight:   0.503kg
ISBN:  

9783110996784


ISBN 10:   3110996782
Pages:   232
Publication Date:   18 July 2022
Audience:   Professional and scholarly ,  Professional & Vocational ,  Professional & Vocational
Format:   Paperback
Publisher's Status:   Active
Availability:   Available To Order   Availability explained
We have confirmation that this item is in stock with the supplier. It will be ordered in for you and dispatched immediately.

Table of Contents

Reviews

Author Information

Sam Mitchell, Mount Holyoke College, South Hadley, Massachusetts, USA.

Tab Content 6

Author Website:  

Customer Reviews

Recent Reviews

No review item found!

Add your own review!

Countries Available

All regions
Latest Reading Guide

MRG2025CC

 

Shopping Cart
Your cart is empty
 Shopping cart
Mailing List

 

Sign up now