Fatigue Testing and Analysis

Author:   Yung-Li Lee ,  Jwo Pan ,  Richard Hathaway ,  Mark Barkey
Publisher:   Butterworth-Heinemann
ISBN:  

9781281009692


Pages:   402
Publication Date:   09 June 2008
Format:   Electronic book text
Availability:   Available To Order   Availability explained
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Fatigue Testing and Analysis


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Overview

Fatigue Testing and Analysis: Theory and Practice presents the latest, proven techniques for fatigue data acquisition, data analysis, and test planning and practice. More specifically, it covers the most comprehensive methods to capture the component load, to characterize the scatter of product fatigue resistance and loading, to perform the fatigue damage assessment of a product, and to develop an accelerated life test plan for reliability target demonstration. This book is most useful for test and design engineers in the ground vehicle industry. Fatigue Testing andAnalysis introduces the methods to account for variability of loads and statistical fatigue properties that are useful for further probabilistic fatigue analysis. The text incorporates and demonstrates approaches that account for randomness of loading and materials, and covers the applications and demonstrations of both linear and double-linear damage rules. The reader will benefit from summaries of load transducer designs and data acquisition techniques, applications of both linear and non-linear damage rules and methods, and techniques to determine the statistical fatigue properties for the nominal stress-life and the local strain-life methods. .Covers the useful techniques for component load measurement and data acquisition, fatigue properties determination, fatigue analysis, and accelerated life test criteria development, and, most importantly, test plans for reliability demonstrations. .Written from a practical point of view, based on the authors' industrial and academic experience in automotive engineering design..Extensive practical examples are used to illustrate the main concepts in all chapters.

Full Product Details

Author:   Yung-Li Lee ,  Jwo Pan ,  Richard Hathaway ,  Mark Barkey
Publisher:   Butterworth-Heinemann
Imprint:   Butterworth-Heinemann
ISBN:  

9781281009692


ISBN 10:   1281009695
Pages:   402
Publication Date:   09 June 2008
Audience:   General/trade ,  General
Format:   Electronic book text
Publisher's Status:   Active
Availability:   Available To Order   Availability explained
We have confirmation that this item is in stock with the supplier. It will be ordered in for you and dispatched immediately.

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