Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits

Author:   M. Bushnell ,  Vishwani Agrawal
Publisher:   Kluwer Academic Publishers
Edition:   1st Corrected ed. 2002. Corr. 2nd printing 2004
Volume:   17
ISBN:  

9780792379911


Pages:   690
Publication Date:   30 November 2000
Format:   Hardback
Availability:   In Print   Availability explained
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Essentials of Electronic Testing for Digital, Memory and Mixed-Signal VLSI Circuits


Overview

Today's electronic design and test engineers deal with several types of subsystems, namely, digital, memory, and mixed-signal, each requiring different test and design for testability methods. This book provides a careful selection of essential topics on all three types of circuits. The outcome of testing is product quality, which means ""meeting the user's needs at a minimum cost"". The book includes test economics and techniques for determining the defect level of VLSI chips. Besides being a textbook for a course on testing, it is a complete testability guide for an engineer working on any kind of electronic device or system or a system-on-a-chip.

Full Product Details

Author:   M. Bushnell ,  Vishwani Agrawal
Publisher:   Kluwer Academic Publishers
Imprint:   Kluwer Academic Publishers
Edition:   1st Corrected ed. 2002. Corr. 2nd printing 2004
Volume:   17
Dimensions:   Width: 17.80cm , Height: 3.80cm , Length: 25.40cm
Weight:   3.180kg
ISBN:  

9780792379911


ISBN 10:   0792379918
Pages:   690
Publication Date:   30 November 2000
Audience:   College/higher education ,  Professional and scholarly ,  Postgraduate, Research & Scholarly ,  Professional & Vocational
Format:   Hardback
Publisher's Status:   Active
Availability:   In Print   Availability explained
This item will be ordered in for you from one of our suppliers. Upon receipt, we will promptly dispatch it out to you. For in store availability, please contact us.

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