|
|
|||
|
||||
OverviewToday's electronic design and test engineers deal with several types of subsystems, namely, digital, memory, and mixed-signal, each requiring different test and design for testability methods. This book provides a careful selection of essential topics on all three types of circuits. The outcome of testing is product quality, which means ""meeting the user's needs at a minimum cost"". The book includes test economics and techniques for determining the defect level of VLSI chips. Besides being a textbook for a course on testing, it is a complete testability guide for an engineer working on any kind of electronic device or system or a system-on-a-chip. Full Product DetailsAuthor: M. Bushnell , Vishwani AgrawalPublisher: Kluwer Academic Publishers Imprint: Kluwer Academic Publishers Edition: 1st Corrected ed. 2002. Corr. 2nd printing 2004 Volume: 17 Dimensions: Width: 17.80cm , Height: 3.80cm , Length: 25.40cm Weight: 3.180kg ISBN: 9780792379911ISBN 10: 0792379918 Pages: 690 Publication Date: 30 November 2000 Audience: College/higher education , Professional and scholarly , Postgraduate, Research & Scholarly , Professional & Vocational Format: Hardback Publisher's Status: Active Availability: In Print This item will be ordered in for you from one of our suppliers. Upon receipt, we will promptly dispatch it out to you. For in store availability, please contact us. Table of ContentsReviewsAuthor InformationTab Content 6Author Website:Countries AvailableAll regions |
||||