Epioptics: Linear and Nonlinear Optical Spectroscopy of Surfaces and Interfaces
Author:   J.F. McGilp ,  etc. ,  D. Weaire ,  C. Patterson (University of Dublin, Ireland)
Publisher:   Springer-Verlag Berlin and Heidelberg GmbH & Co. KG
ISBN:  

9783540594109


Pages:   242
Publication Date:   09 October 1995
Format:   Hardback
Availability:   Out of stock   Availability explained
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Epioptics: Linear and Nonlinear Optical Spectroscopy of Surfaces and Interfaces


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Overview

This text describes recent developments in optical techniques for extracting surface and interface information with a resolution of less than a single atomic layer. These ""epioptic"" techniques are now widely applied to semiconductor surfaces and interfaces and include polarised reflection techniques such as reflection anisotropy spectroscopy and spectroscopic ellipsometry, Raman scattering, and optical second harmonic and sum frequency generation. Epioptics has great potential in the area of growth monitoring, and in situ monitoring of semiconductor growth with submonolayer sensitivity has now been demonstrated in growth reactors under normal operating conditions. The book emphasizes recent studies of submonolayer growth on semiconductor surfaces.

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Author:   J.F. McGilp ,  etc. ,  D. Weaire ,  C. Patterson (University of Dublin, Ireland)
Publisher:   Springer-Verlag Berlin and Heidelberg GmbH & Co. KG
Imprint:   Springer-Verlag Berlin and Heidelberg GmbH & Co. K
Weight:   0.500kg
ISBN:  

9783540594109


ISBN 10:   3540594108
Pages:   242
Publication Date:   09 October 1995
Audience:   College/higher education ,  Professional and scholarly ,  Postgraduate, Research & Scholarly ,  Professional & Vocational
Format:   Hardback
Publisher's Status:   Active
Availability:   Out of stock   Availability explained
The supplier is temporarily out of stock of this item. It will be ordered for you on backorder and shipped when it becomes available.

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