|
![]() |
|||
|
||||
OverviewFull Product DetailsAuthor: Onn Shehory , Eitan Farchi , Guy BarashPublisher: Springer Nature Switzerland AG Imprint: Springer Nature Switzerland AG Edition: 1st ed. 2020 Volume: 1272 Weight: 0.454kg ISBN: 9783030621438ISBN 10: 303062143 Pages: 141 Publication Date: 08 November 2020 Audience: Professional and scholarly , Professional & Vocational Format: Paperback Publisher's Status: Active Availability: Manufactured on demand ![]() We will order this item for you from a manufactured on demand supplier. Table of ContentsQuality Management of Deep Learning Systems.- Can Attention Masks Improve Adversarial Robustness?.- Learner-Independent Data Omission Attacks.- Extraction of Complex DNN Models: Real Threat or Boogeyman?.- Principal Component Properties of Adversarial Samples.- FreaAI: Automated extraction of data slices to test machine learning models.- Density estimation in representation space to predict model uncertainty.- Automated detection of drift in deep learning based classifiers using network embedding.- Quality of syntactic implication of RL-based sentence summarization.- Dependable Neural Networks for Safety Critical Tasks.ReviewsAuthor InformationTab Content 6Author Website:Countries AvailableAll regions |