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OverviewThis volume presents a summary of the electron optics, electron-specimen interactions, and operation and contrast modes of this new field of analytical electron microscopy. The electron optics of filter lenses and the progress in the correction of aberrations are discussed in detail. An evaluation of our present knowledge of plasmon losses and inner-shell ionizations is of increasing interest for the application of EFTEM in materials science. Full Product DetailsAuthor: Ludwig Reimer , Peter Hawkes , C. Deininger , R. F. EgertonPublisher: Springer-Verlag Berlin and Heidelberg GmbH & Co. KG Imprint: Springer-Verlag Berlin and Heidelberg GmbH & Co. K Volume: v. 71 Weight: 0.790kg ISBN: 9783540584797ISBN 10: 354058479 Pages: 438 Publication Date: 11 April 1995 Audience: College/higher education , Professional and scholarly , Postgraduate, Research & Scholarly , Professional & Vocational Format: Hardback Publisher's Status: Active Availability: Out of stock ![]() The supplier is temporarily out of stock of this item. It will be ordered for you on backorder and shipped when it becomes available. Table of ContentsReviews""This book gives an excellent introduction to the topic...and can be advised both as a text book for researchers new in this field as well as those looking for a basic reference to the topic."" - Physicalia This book gives an excellent introduction to the topic...and can be advised both as a text book for researchers new in this field as well as those looking for a basic reference to the topic. - Physicalia Author InformationTab Content 6Author Website:Countries AvailableAll regions |