Energy Dispersive X-ray Analysis in the Electron Microscope

Author:   DC Bell ,  AJ Garratt-Reed
Publisher:   Taylor & Francis Ltd
ISBN:  

9781859961094


Pages:   160
Publication Date:   10 July 2003
Format:   Paperback
Availability:   In Print   Availability explained
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Energy Dispersive X-ray Analysis in the Electron Microscope


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Author:   DC Bell ,  AJ Garratt-Reed
Publisher:   Taylor & Francis Ltd
Imprint:   Bios Scientific Publishers Ltd
Dimensions:   Width: 15.20cm , Height: 0.90cm , Length: 22.90cm
Weight:   0.249kg
ISBN:  

9781859961094


ISBN 10:   1859961096
Pages:   160
Publication Date:   10 July 2003
Audience:   College/higher education ,  General/trade ,  Tertiary & Higher Education ,  General
Format:   Paperback
Publisher's Status:   Active
Availability:   In Print   Availability explained
This item will be ordered in for you from one of our suppliers. Upon receipt, we will promptly dispatch it out to you. For in store availability, please contact us.

Table of Contents

Ch 1. HISTORY. Ch 2. PRINCIPLES. What are X-rays?. Ionization cross-section. Fluorescence yield. X-ray absorption. Insulators, conductors and semiconductors. Ch 3. THE ENERGY-DISPERSIVE X-RAY DETECTOR. Introduction.The semiconductor X-ray detector. The X-ray analyser. Details of the spectrum. New detector technologies. Ch 4. SPECTRAL PROCESSING. Introduction. Background stripping. Background modelling. Deconvolution of overlapping peaks. Statistical considerations. The impact of statistics. The effect of the background. Analytical strategy. Ch 5. ENERGY-DISPERSIVE X-RAY MICROANALYSIS IN THE SCANNING ELECTRON MICROSCOPE. Introduction. Fundamentals of X-ray analysis in the SEM. Quantitative microanalysis in the SEM. Semi-quantitative microanalysis in the SEM. EDX analysis in the VP-SEM and ESEM. Inhomogeneous samples. Concluding remarks. Ch 6. X-RAY MICROANALYSIS IN THE TRANSMISSION ELECTRON MICROSCOPE. Introduction. Principles of quantitative analysis in the TEM. Absorption, fluorescence and other sources of error. Spatial resolution. Microscope considerations. Ch 7. X-RAY MAPPING. Introduction. Hardware implementation. Statistical considerations. Other applications. Concluding comments. Ch 8. ENERGY-DISPERSIVE X-RAY ANALYSIS COMPARED WITH OTHER TECHNIQUES. Introduction. Wavelength-dispersive X-ray analysis - electron probe microanalysis (EPMA). Electron energy-loss spectroscopy (EELS). Auger electron spectroscopy (AES). X-ray photoelectron spectroscopy (XPS). X-ray fluorescence (XRF). Atom probe. Overall strengths and weaknesses.

Reviews

'There are numerous good textbooks on the subject, but these are necessarily complicated and contain far more information than is needed to answer the basic questions. The authors have recognised this and have set out to produce something simpler and more easily read...In conclusion, this handbook maintains the Royal Microscopical Society series tradition of bein easy to read and understand.' - The Royal College of Pathologists


'There are numerous good textbooks on the subject, but these are necessarily complicated and contain far more information than is needed to answer the basic questions. The authors have recognised this and have set out to produce something simpler and more easily read...In conclusion, this handbook maintains the Royal Microscopical Society series tradition of bein easy to read and understand.' - The Royal College of Pathologists


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DC Bell, AJ Garratt-Reed

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