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OverviewEmerging Nanotechnologies: Test, Defect Tolerance and Reliability covers various technologies that have been developing over the last decades such as chemically assembled electronic nanotechnology, Quantum-dot Cellular Automata (QCA), and nanowires and carbon nanotubes. Each of these technologies offers various advantages and disadvantages. Some suffer from high power, some work in very low temperatures and some others need indeterministic bottom-up assembly. These emerging technologies are not considered as a direct replacement for CMOS technology and may require a completely new architecture to achieve their functionality. Emerging Nanotechnologies: Test, Defect Tolerance and Reliability brings all of these issues together in one place for readers and researchers who are interested in this rapidly changing field. Full Product DetailsAuthor: Mohammad TehranipoorPublisher: Springer-Verlag New York Inc. Imprint: Springer-Verlag New York Inc. Edition: 2008 ed. Volume: 37 Dimensions: Width: 15.50cm , Height: 2.30cm , Length: 23.50cm Weight: 0.799kg ISBN: 9780387747460ISBN 10: 038774746 Pages: 408 Publication Date: 10 December 2007 Audience: Professional and scholarly , Professional & Vocational Format: Hardback Publisher's Status: Active Availability: In Print This item will be ordered in for you from one of our suppliers. Upon receipt, we will promptly dispatch it out to you. For in store availability, please contact us. Table of ContentsReviewsAuthor InformationTab Content 6Author Website:Countries AvailableAll regions |
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