Emerging Nanotechnologies: Test, Defect Tolerance, and Reliability

Author:   Mohammad Tehranipoor
Publisher:   Springer-Verlag New York Inc.
Edition:   2008 ed.
Volume:   37
ISBN:  

9780387747460


Pages:   408
Publication Date:   10 December 2007
Format:   Hardback
Availability:   In Print   Availability explained
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Emerging Nanotechnologies: Test, Defect Tolerance, and Reliability


Overview

Emerging Nanotechnologies: Test, Defect Tolerance and Reliability covers various technologies that have been developing over the last decades such as chemically assembled electronic nanotechnology, Quantum-dot Cellular Automata (QCA), and nanowires and carbon nanotubes. Each of these technologies offers various advantages and disadvantages. Some suffer from high power, some work in very low temperatures and some others need indeterministic bottom-up assembly. These emerging technologies are not considered as a direct replacement for CMOS technology and may require a completely new architecture to achieve their functionality. Emerging Nanotechnologies: Test, Defect Tolerance and Reliability brings all of these issues together in one place for readers and researchers who are interested in this rapidly changing field.

Full Product Details

Author:   Mohammad Tehranipoor
Publisher:   Springer-Verlag New York Inc.
Imprint:   Springer-Verlag New York Inc.
Edition:   2008 ed.
Volume:   37
Dimensions:   Width: 15.50cm , Height: 2.30cm , Length: 23.50cm
Weight:   0.799kg
ISBN:  

9780387747460


ISBN 10:   038774746
Pages:   408
Publication Date:   10 December 2007
Audience:   Professional and scholarly ,  Professional & Vocational
Format:   Hardback
Publisher's Status:   Active
Availability:   In Print   Availability explained
This item will be ordered in for you from one of our suppliers. Upon receipt, we will promptly dispatch it out to you. For in store availability, please contact us.

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