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OverviewElectron Microscopy and Analysis deals with several sophisticated techniques for magnifying images of very small objects by large amounts - especially in a physical science context. It has been ten years since the last edition of Electron Microscopy and Analysis was published and there have been rapid changes in this field since then. The authors have vastly updated their very successful second edition, which is already established as an essential laboratory manual worldwide, and they have incorporated questions and answers in each chapter for ease of learning. Equally as relevant for material scientists and bioscientists, this third edition is an essential textbook. Full Product DetailsAuthor: Peter J. Goodhew , John Humphreys (The University of Manchester, England, UK) , Richard Beanland (GEC-Marconi Materials Technology, England, UK) , L. E. CartwrightPublisher: Taylor & Francis Ltd Imprint: Taylor & Francis Ltd Edition: 3rd edition Dimensions: Width: 15.60cm , Height: 1.40cm , Length: 23.40cm Weight: 0.385kg ISBN: 9780748409686ISBN 10: 0748409688 Pages: 264 Publication Date: 30 November 2000 Audience: College/higher education , Professional and scholarly , Undergraduate , Postgraduate, Research & Scholarly Format: Paperback Publisher's Status: Active Availability: In Print ![]() This item will be ordered in for you from one of our suppliers. Upon receipt, we will promptly dispatch it out to you. For in store availability, please contact us. Table of ContentsReviewsAuthor InformationPeter J. Goodhew, John Humphreys The University of Manchester, Richard Beanland GEC Marconi Materials Technology, England. Tab Content 6Author Website:Countries AvailableAll regions |