Electron Microscopy and Analysis
Author:   Peter J. Goodhew ,  John Humphreys (The University of Manchester, England, UK) ,  Richard Beanland (GEC-Marconi Materials Technology, England, UK)
Publisher:   Taylor & Francis Ltd
Edition:   3rd edition
ISBN:  

9781138441538


Pages:   264
Publication Date:   07 July 2017
Format:   Hardback
Availability:   In Print   Availability explained
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Electron Microscopy and Analysis


Overview

Electron Microscopy and Analysis deals with several sophisticated techniques for magnifying images of very small objects by large amounts - especially in a physical science context. It has been ten years since the last edition of Electron Microscopy and Analysis was published and there have been rapid changes in this field since then. The authors have vastly updated their very successful second edition, which is already established as an essential laboratory manual worldwide, and they have incorporated questions and answers in each chapter for ease of learning. Equally as relevant for material scientists and bioscientists, this third edition is an essential textbook.

Full Product Details

Author:   Peter J. Goodhew ,  John Humphreys (The University of Manchester, England, UK) ,  Richard Beanland (GEC-Marconi Materials Technology, England, UK)
Publisher:   Taylor & Francis Ltd
Imprint:   CRC Press
Edition:   3rd edition
Weight:   0.650kg
ISBN:  

9781138441538


ISBN 10:   1138441538
Pages:   264
Publication Date:   07 July 2017
Audience:   Professional and scholarly ,  Professional & Vocational
Format:   Hardback
Publisher's Status:   Active
Availability:   In Print   Availability explained
This item will be ordered in for you from one of our suppliers. Upon receipt, we will promptly dispatch it out to you. For in store availability, please contact us.

Table of Contents

Preface; Abbreviations; 1. Microscopy with Light and Electrons 2. Electrons and Their Interaction with the Specimen 3. Electron Diffraction 4. The Transmission Electron Microscope 5. The Scanning Electron Microscope 6. Chemical Analysis in the Electron Microscope 7. Electron Microscopy and Other Techniques; Further Reading; Index

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Author Information

Peter J. Goodhew, John Humphreys The University of Manchester, Richard Beanland GEC Marconi Materials Technology, England.

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Latest Reading Guide

NOV RG 20252

 

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