Electron Microscopy and Analysis 1997, Proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference, University of Cambridge, 2-5 September 1997
Author:   John M. Rodenburg
Publisher:   Taylor & Francis Ltd
Volume:   No. 153
ISBN:  

9780750304412


Pages:   708
Publication Date:   01 January 1997
Format:   Hardback
Availability:   In Print   Availability explained
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Electron Microscopy and Analysis 1997, Proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference, University of Cambridge, 2-5 September 1997


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Overview

This volume explores the development and applications of electron microscopy from its first introduction. As with previous meetings in the series, recent advances in electron microscopy and related analytical techniques practised on electron microscopes are discussed. Particular emphasis is given to the development of new instrumentation, analysis of the information content of images and spectra and applications to the study of materials. Progress in complementary techniques such as scanning probe microscopies and image processing is also examined.

Full Product Details

Author:   John M. Rodenburg
Publisher:   Taylor & Francis Ltd
Imprint:   Institute of Physics Publishing
Volume:   No. 153
Dimensions:   Width: 15.60cm , Height: 3.80cm , Length: 23.40cm
Weight:   1.338kg
ISBN:  

9780750304412


ISBN 10:   0750304413
Pages:   708
Publication Date:   01 January 1997
Audience:   College/higher education ,  Professional and scholarly ,  Postgraduate, Research & Scholarly ,  Professional & Vocational
Format:   Hardback
Publisher's Status:   Active
Availability:   In Print   Availability explained
This item will be ordered in for you from one of our suppliers. Upon receipt, we will promptly dispatch it out to you. For in store availability, please contact us.

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John M. Rodenburg

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