Electron Microscopy and Analysis 1999: Proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference, University of Sheffield, 24-27 August 1999
Author:   C. J. Kiely (Department of Engineering, University of Liverpool, UK)
Publisher:   Taylor & Francis Ltd
Volume:   161
ISBN:  

9780750305778


Pages:   632
Publication Date:   01 December 1999
Format:   Hardback
Availability:   Out of stock   Availability explained


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Electron Microscopy and Analysis 1999: Proceedings of the Institute of Physics Electron Microscopy and Analysis Group Conference, University of Sheffield, 24-27 August 1999


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Overview

This collection of papers provide an overview of developments and outline opportunities for future research in electron imaging; electron energy-loss and X-ray analysis; scanning probe and electron beam microscopy; and the wide-ranging applications of these techniques in materials science, metallurgy and surface science. EMAG is a recognised forum for discussion and dissemination of results, for those working predominently in materials science, who wish to remain abreast of the continuing improvements in instrumentation techniques and the consequent developments in their use to study materials.

Full Product Details

Author:   C. J. Kiely (Department of Engineering, University of Liverpool, UK)
Publisher:   Taylor & Francis Ltd
Imprint:   Institute of Physics Publishing
Volume:   161
Dimensions:   Width: 15.60cm , Height: 4.00cm , Length: 23.50cm
Weight:   1.043kg
ISBN:  

9780750305778


ISBN 10:   0750305770
Pages:   632
Publication Date:   01 December 1999
Audience:   College/higher education ,  Professional and scholarly ,  Postgraduate, Research & Scholarly ,  Professional & Vocational
Format:   Hardback
Publisher's Status:   Out of Print
Availability:   Out of stock   Availability explained

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