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OverviewElectron microscopy is now a mainstay characterization tool for solid state physicists and chemists as well as materials scientists. Containing the proceedings from the Electron Microscopy and Analysis Group (EMAG) conference in September 2003, this volume covers current developments in the field, primarily in the UK. These conferences are biennial events organized by the EMAG of the Institute of Physics to provide a forum for discussion of the latest developments in instrumentation, techniques, and applications of electron and scanning probe microscopies. Full Product DetailsAuthor: S McVitie , D McCombPublisher: Taylor & Francis Ltd Imprint: Institute of Physics Publishing Dimensions: Width: 15.20cm , Height: 3.10cm , Length: 22.90cm Weight: 0.952kg ISBN: 9780750309677ISBN 10: 0750309679 Pages: 506 Publication Date: 19 February 2004 Audience: Professional and scholarly , Professional & Vocational Format: Hardback Publisher's Status: Active Availability: In Print ![]() This item will be ordered in for you from one of our suppliers. Upon receipt, we will promptly dispatch it out to you. For in store availability, please contact us. Table of ContentsReviewsAuthor InformationStephen McVitie, David McComb Tab Content 6Author Website:Countries AvailableAll regions |