Electron and Ion Microscopy and Microanalysis: Principles and Applications, Second Edition,
Author:   Lawrence E Murr
Publisher:   Taylor & Francis Ltd
Edition:   2nd edition
ISBN:  

9780367402945


Pages:   856
Publication Date:   29 October 2019
Format:   Paperback
Availability:   In Print   Availability explained
This item will be ordered in for you from one of our suppliers. Upon receipt, we will promptly dispatch it out to you. For in store availability, please contact us.

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Electron and Ion Microscopy and Microanalysis: Principles and Applications, Second Edition,


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Overview

The publication date of the first edition is not stated, but the new edition is apparently considerably revised and expanded. It was written to serve as a multi-purpose text at the senior or graduate level and as a reference for the practicing scientist or engineer. Readers should have a math backgr

Full Product Details

Author:   Lawrence E Murr
Publisher:   Taylor & Francis Ltd
Imprint:   CRC Press
Edition:   2nd edition
Weight:   1.578kg
ISBN:  

9780367402945


ISBN 10:   0367402947
Pages:   856
Publication Date:   29 October 2019
Audience:   Professional and scholarly ,  Professional & Vocational
Format:   Paperback
Publisher's Status:   Active
Availability:   In Print   Availability explained
This item will be ordered in for you from one of our suppliers. Upon receipt, we will promptly dispatch it out to you. For in store availability, please contact us.

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