|
![]() |
|||
|
||||
OverviewFull Product DetailsAuthor: Lawrence E MurrPublisher: Taylor & Francis Inc Imprint: CRC Press Inc Edition: 2nd edition Volume: 29 Dimensions: Width: 17.80cm , Height: 4.50cm , Length: 25.40cm Weight: 1.587kg ISBN: 9780824785567ISBN 10: 0824785568 Pages: 856 Publication Date: 25 July 1991 Audience: College/higher education , Professional and scholarly , Undergraduate , Postgraduate, Research & Scholarly Format: Hardback Publisher's Status: Active Availability: In Print ![]() This item will be ordered in for you from one of our suppliers. Upon receipt, we will promptly dispatch it out to you. For in store availability, please contact us. Table of ContentsCHAPTER 1: FUNDAMENTAL PROPERTIES OF ELECTRONS AND IONS. CHAPTER 2: ELECTRON EMISSION AND EMISSION AND IONIZATION MICROSCOPY. CHAPTER. 3: ELECTRON AND ION OPTICS AND OPTICAL SYSTEMS. CHAPTER 4: ELECTRON AND ION PROBE MICROANALYSIS. CHAPTER 5: ELECTRON AND ION MICROSCOPY OF SURFACES. CHAPTER 6: ELECTRON DIFFRACTION. CHAPTER 7: TRANSMISSION ELECTRON MICROSCOPY. CHAPTER 8: HIGH-VOLTAGE ELECTRON MICROSCOPY.ReviewsAuthor InformationLawrence E. Murr Tab Content 6Author Website:Countries AvailableAll regions |