Electromigration and Electronic Device Degradation
Author:   Aris Christou (CALCE Electronic Packaging Research Center, University of Maryland)
Publisher:   John Wiley & Sons Inc
ISBN:  

9780471584896


Pages:   343
Publication Date:   07 February 1994
Format:   Hardback
Availability:   Out of stock   Availability explained
The supplier is temporarily out of stock of this item. It will be ordered for you on backorder and shipped when it becomes available.

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Electromigration and Electronic Device Degradation


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Author:   Aris Christou (CALCE Electronic Packaging Research Center, University of Maryland)
Publisher:   John Wiley & Sons Inc
Imprint:   Wiley-Interscience
Dimensions:   Width: 16.00cm , Height: 2.00cm , Length: 24.00cm
Weight:   0.680kg
ISBN:  

9780471584896


ISBN 10:   0471584894
Pages:   343
Publication Date:   07 February 1994
Audience:   College/higher education ,  Professional and scholarly ,  General/trade ,  Postgraduate, Research & Scholarly ,  Professional & Vocational
Format:   Hardback
Publisher's Status:   Active
Availability:   Out of stock   Availability explained
The supplier is temporarily out of stock of this item. It will be ordered for you on backorder and shipped when it becomes available.

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Aris Christou is the author of Electromigration and Electronic Device Degradation, published by Wiley.

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