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OverviewElectromagnetic Field Standards and Exposure Systems covers the broader fields of measurements in telecommunications, radio navigation, radio astronomy, bioscience, and free ranging EM radiation and helps to develop the following measurement standards; * proper calibration of the measuring instrument * external environmental factors that affect accuracy * competence and training of the instrument operator Full Product DetailsAuthor: Eugeniusz Grudzinski (Head of EMF Standards and Measurements Lab, Technical University of Wroclaw, Poland) , Hubert Trzaska (Head of EM Environment Protection Lab, University of Wroclaw, Poland)Publisher: SciTech Publishing Inc Imprint: SciTech Publishing Inc Dimensions: Width: 15.20cm , Height: 1.90cm , Length: 22.90cm ISBN: 9781613531778ISBN 10: 161353177 Pages: 216 Publication Date: 10 December 2013 Audience: College/higher education , Professional and scholarly , Tertiary & Higher Education , Professional & Vocational Format: Hardback Publisher's Status: Active Availability: In Print ![]() This item will be ordered in for you from one of our suppliers. Upon receipt, we will promptly dispatch it out to you. For in store availability, please contact us. Table of ContentsReviewsAuthor InformationDr Eugeniusz Grudzinski, born in 1948 in Wroclaw, Poland. He completed his MSc EE, DSc and Ph.Dr. degrees at the Technical University of Wroclaw in 1973, 1981 and 1998, respectively. He is currently Head of the EMF Standards and Measurements Lab and Lecturer at the University. Dr. Grudzinski is the author of many publications in the field of EMF metrology. His book on EMF standards and measurements was originally published in Polish to immediate success. Prof. Hubert Trzaska born in 1939 in Wilno, Poland (presently Vilnius, Lithuania). He is Head of the EM Environment Protection Lab at the University of Wroclaw, devoting his research to the practical aspects of EMF metrology. He holds over 70 patents in the field of EMF measurements and standards. He is the author of Electromagnetic Measurements in the Near Field, Second Edition (SciTech-IET). Tab Content 6Author Website:Countries AvailableAll regions |