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OverviewFull Product DetailsAuthor: Sean R. Bishop , Nicola H. Perry , Dario Marrocchelli , Brian W. SheldonPublisher: Springer International Publishing AG Imprint: Springer International Publishing AG Edition: 1st ed. 2017 Dimensions: Width: 15.50cm , Height: 1.80cm , Length: 23.50cm Weight: 4.691kg ISBN: 9783319514055ISBN 10: 3319514059 Pages: 192 Publication Date: 27 March 2017 Audience: Professional and scholarly , Professional & Vocational Format: Hardback Publisher's Status: Active Availability: Manufactured on demand ![]() We will order this item for you from a manufactured on demand supplier. Table of ContentsIntroduction.- Conventional Methods for Measurements of Chemo-Mechanical Coupling.- In-situ High-Temperature X-ray Diffraction of Thin Films: Chemical Expansion and Kinetics.- In-situ Neutron Diffraction Experiments.- In situ Wafer Curvature Relaxation Measurements to Determine Surface Exchange Coefficients and Thermo-Chemically Induced Stresses.- Exploring electro-Chemo-Mechanical Phenomena on the Nanoscale Using Scanning Probe Microscopy.- Continuum Level Transport and Electro-Chemo-Mechanics Coupling—Solid Oxide Fuel Cells and Lithium Ion Batteries.ReviewsAuthor InformationTab Content 6Author Website:Countries AvailableAll regions |