Electrical Overstress: The Nemesis of Semiconductor Components
Author:   James Vinson
Publisher:   Springer-Verlag New York Inc.
Edition:   2013
ISBN:  

9781441987785


Pages:   300
Publication Date:   07 January 2016
Format:   Hardback
Availability:   Not yet available   Availability explained
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Electrical Overstress: The Nemesis of Semiconductor Components


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Author:   James Vinson
Publisher:   Springer-Verlag New York Inc.
Imprint:   Springer-Verlag New York Inc.
Edition:   2013
ISBN:  

9781441987785


ISBN 10:   1441987789
Pages:   300
Publication Date:   07 January 2016
Audience:   Professional and scholarly ,  Professional & Vocational
Format:   Hardback
Publisher's Status:   Active
Availability:   Not yet available   Availability explained
This item is yet to be released. You can pre-order this item and we will dispatch it to you upon its release.

Table of Contents

Origins of EOS.- EOS/Surge Standards.- Device Physics at EOS Stress Levels.- EOS Induced Damage.- EOS Protection Elements and Their Use.- Debugging EOS Failures.- Designing EOS Robust Circuits.- Evaluation Techniques for EOS Robustness.

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