Electrical Characterization of Si-Sio2 Interface for Thin Oxides
Author:   洪國光 ,  Kwok-Kwong Hung
Publisher:   Open Dissertation Press
ISBN:  

9781374766150


Publication Date:   27 January 2017
Format:   Hardback
Availability:   Temporarily unavailable   Availability explained
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Electrical Characterization of Si-Sio2 Interface for Thin Oxides


Overview

This dissertation, Electrical Characterization of Si-SiO2 Interface for Thin Oxides by 洪國光, Kwok-kwong, Hung, was obtained from The University of Hong Kong (Pokfulam, Hong Kong) and is being sold pursuant to Creative Commons: Attribution 3.0 Hong Kong License. The content of this dissertation has not been altered in any way. We have altered the formatting in order to facilitate the ease of printing and reading of the dissertation. All rights not granted by the above license are retained by the author. DOI: 10.5353/th_b3123086 Subjects: Silicon - Electric propertiesSilicon oxide films

Full Product Details

Author:   洪國光 ,  Kwok-Kwong Hung
Publisher:   Open Dissertation Press
Imprint:   Open Dissertation Press
Dimensions:   Width: 21.60cm , Height: 1.90cm , Length: 27.90cm
Weight:   1.002kg
ISBN:  

9781374766150


ISBN 10:   1374766151
Publication Date:   27 January 2017
Audience:   General/trade ,  General
Format:   Hardback
Publisher's Status:   Active
Availability:   Temporarily unavailable   Availability explained
The supplier advises that this item is temporarily unavailable. It will be ordered for you and placed on backorder. Once it does come back in stock, we will ship it out to you.

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