Efficient Test Methodologies for High-Speed Serial Links
Author:   Dongwoo Hong ,  Kwang-Ting Cheng
Publisher:   Springer
Edition:   2010 ed.
Volume:   51
ISBN:  

9789400730946


Pages:   98
Publication Date:   01 March 2012
Format:   Paperback
Availability:   Manufactured on demand   Availability explained
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Efficient Test Methodologies for High-Speed Serial Links


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Overview

Efficient Test Methodologies for High-Speed Serial Links describes in detail several new and promising techniques for cost-effectively testing high-speed interfaces with a high test coverage. One primary focus of Efficient Test Methodologies for High-Speed Serial Links is on efficient testing methods for jitter and bit-error-rate (BER), which are widely used for quantifying the quality of a communication system. Various analysis as well as experimental results are presented to demonstrate the validity of the presented techniques.

Full Product Details

Author:   Dongwoo Hong ,  Kwang-Ting Cheng
Publisher:   Springer
Imprint:   Springer
Edition:   2010 ed.
Volume:   51
Dimensions:   Width: 15.50cm , Height: 0.50cm , Length: 23.50cm
Weight:   0.454kg
ISBN:  

9789400730946


ISBN 10:   9400730942
Pages:   98
Publication Date:   01 March 2012
Audience:   Professional and scholarly ,  Professional & Vocational
Format:   Paperback
Publisher's Status:   Active
Availability:   Manufactured on demand   Availability explained
We will order this item for you from a manufactured on demand supplier.

Table of Contents

An Efficient Jitter Measurement Technique.- BER Estimation for Linear Clock and Data Recovery Circuit.- BER Estimation for Non-linear Clock and Data Recovery Circuit.- Gaps in Timing Margining Test.- An Accurate Jitter Estimation Technique.- A Two-Tone Test Method for Continuous-Time Adaptive Equalizers.- Conclusions.

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