Distribution-Free Methods for Statistical Process Monitoring and Control

Author:   Markos V. Koutras ,  Ioannis S. Triantafyllou
Publisher:   Springer Nature Switzerland AG
Edition:   1st ed. 2020
ISBN:  

9783030250836


Pages:   257
Publication Date:   26 August 2021
Format:   Paperback
Availability:   Manufactured on demand   Availability explained
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Distribution-Free Methods for Statistical Process Monitoring and Control


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Overview

This book explores nonparametric statistical process control. It provides an up-to-date overview of nonparametric Shewhart-type univariate control charts, and reviews the recent literature on nonparametric charts, particularly multivariate schemes. Further, it discusses observations tied to the monitored population quantile, focusing on the Shewhart Sign chart. The book also addresses the issue of practically assuming the normality and the independence when a process is statistically monitored, and examines in detail change-point analysis-based distribution-free control charts designed for Phase I applications. Moreover, it introduces six distribution-free EWMA schemes for simultaneously monitoring the location and scale parameters of a univariate continuous process, and establishes two nonparametric Shewhart-type control charts based on order statistics with signaling runs-type rules. Lastly, the book proposes novel and effective method for early disease detection.

Full Product Details

Author:   Markos V. Koutras ,  Ioannis S. Triantafyllou
Publisher:   Springer Nature Switzerland AG
Imprint:   Springer Nature Switzerland AG
Edition:   1st ed. 2020
Weight:   0.415kg
ISBN:  

9783030250836


ISBN 10:   3030250830
Pages:   257
Publication Date:   26 August 2021
Audience:   Professional and scholarly ,  Professional & Vocational
Format:   Paperback
Publisher's Status:   Active
Availability:   Manufactured on demand   Availability explained
We will order this item for you from a manufactured on demand supplier.

Table of Contents

An Overview of Nonparametric Control Charts.- Distribution-free Control Charts for Monitoring the Location Parameter.- Nonparametric Control Charts for Monitoring the Dispersion Parameter.- Bivariate Nonparametric Control Charts.- Exponentially Weighted Moving Average Control Charts based on Ranks.- Cumulative Sum Control Charts based on Ranks.- Nonparametric Control Charts based on Order Statistics.- The Run-Length Distribution of Nonparametric Control Charts.- Distribution-free Control Charts for Joint Monitoring Location and Scale.- Distribution-free Phase II Control Charts for Monitoring Continuous Process.

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Author Information

Markos V. Koutras is a Full Professor at the Department of Statistics and Insurance Science, University of Piraeus, Greece. He received his B.S. in Mathematics and holds an M.Sc. in Computer Science and Operations Research and a Ph.D. in Statistics. He has authored more than 90 publications in referred journals, 20 publications in referred special volumes (by invitation). He has authored/co-authored 10 books in Greek and 5 in English (2 of them forthcoming). He currently serves on the editorial board of several journals (Annals of the Institute of Statistical Mathematics, Methodology and Computing in Applied Probability, Communications in Statistics etc) and he has been reviewer for more than 35 Journals. His research interests include the theory of run and scan statistics, statistical process control, reliability theory, nonparametric statistics and multivariate statistical analysis.  Ioannis S. Triantafyllou is an Assistant Professor at the Department of Computer Science and Biomedical Informatics, University of Thessaly, Greece. He received his B.S. degree in Mathematics from the University of Athens, Greece, and his M.Sc. and Ph.D. degrees in Statistics from the University of Piraeus, Greece. He has published over 40 peer-reviewed papers in international refereed scientific journals, edited volumes and conference proceedings, and has served as referee for more than 15 scientific journals. His research interests include applied probability, nonparametric statistics, reliability theory and statistical process control.

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