Digital Noise Monitoring of Defect Origin
Author:   Telman Aliev
Publisher:   Springer-Verlag New York Inc.
Edition:   1st ed. Softcover of orig. ed. 2007
Volume:   2
ISBN:  

9781441944108


Pages:   224
Publication Date:   24 November 2010
Format:   Paperback
Availability:   Out of print, replaced by POD   Availability explained
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Digital Noise Monitoring of Defect Origin


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Author:   Telman Aliev
Publisher:   Springer-Verlag New York Inc.
Imprint:   Springer-Verlag New York Inc.
Edition:   1st ed. Softcover of orig. ed. 2007
Volume:   2
Dimensions:   Width: 15.50cm , Height: 1.20cm , Length: 23.50cm
Weight:   0.454kg
ISBN:  

9781441944108


ISBN 10:   1441944109
Pages:   224
Publication Date:   24 November 2010
Audience:   Professional and scholarly ,  Professional & Vocational
Format:   Paperback
Publisher's Status:   Active
Availability:   Out of print, replaced by POD   Availability explained
We will order this item for you from a manufatured on demand supplier.

Table of Contents

Difficulties of Monitoring a Defect at Its Origin and Its Dataware Features.- Position-Binary Technology of Monitoring Defect at its Origin.- Technology of Digital Analysis of Noise as a Carrier of Information about the Beginning of a Defect's Origin.- Robust Correlation Monitoring of a Defect at its Origin.- Spectral Monitoring of a Defect's Origin.- The Digital Technology of Forecasting Failures by Considering Noise as a Data Carrier.- The Technology of Monitoring a Defect's Origin by Considering Noise as a Data Carrier.

Reviews

From the reviews: The monograph builds on a long series of publications by the author over the last decade. ... monograph should benefit researchers and practicing engineers ... particularly those in search of new application tools in quality engineering applied in a broad setting. ... In summary this monograph is undoubtedly going to be a valuable research tool in the hands of an applied scientist, an engineer and a quality reliability engineer in industry. (Sailes K. Sengupta, Technometrics, Vol. 53 (1), February, 2011)


From the reviews: The monograph builds on a long series of publications by the author over the last decade. ! monograph should benefit researchers and practicing engineers ! particularly those in search of new application tools in quality engineering applied in a broad setting. ! In summary this monograph is undoubtedly going to be a valuable research tool in the hands of an applied scientist, an engineer and a quality reliability engineer in industry. (Sailes K. Sengupta, Technometrics, Vol. 53 (1), February, 2011)


From the reviews: “The monograph builds on a long series of publications by the author over the last decade. … monograph should benefit researchers and practicing engineers … particularly those in search of new application tools in quality engineering applied in a broad setting. … In summary this monograph is undoubtedly going to be a valuable research tool in the hands of an applied scientist, an engineer and a quality reliability engineer in industry.” (Sailes K. Sengupta, Technometrics, Vol. 53 (1), February, 2011)


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