Developments in Dielectric Materials and Electronic Devices: Proceedings of the 106th Annual Meeting of The American Ceramic Society, Indianapolis, Indiana, USA 2004
Author:   K. M. Nair ,  Ruyan Guo ,  Amar S. Bhalla ,  S.-I. Hirano
Publisher:   John Wiley & Sons Inc
Volume:   v. 167
ISBN:  

9781574981889


Pages:   428
Publication Date:   16 March 2006
Format:   Paperback
Availability:   Out of stock   Availability explained
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Developments in Dielectric Materials and Electronic Devices: Proceedings of the 106th Annual Meeting of The American Ceramic Society, Indianapolis, Indiana, USA 2004


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Overview

Papers in this volume include topics such as materials synthesis and processing; relaxors; novel compositions; material design; materials for multilayer electronic devices; processing-microstructure-property relationship; applications; environmental issues; and economic/cost analysis of tomorrow's electronic devices. Includes 38 papers.

Full Product Details

Author:   K. M. Nair ,  Ruyan Guo ,  Amar S. Bhalla ,  S.-I. Hirano
Publisher:   John Wiley & Sons Inc
Imprint:   Wiley-American Ceramic Society
Volume:   v. 167
Dimensions:   Width: 15.30cm , Height: 2.40cm , Length: 22.50cm
Weight:   0.569kg
ISBN:  

9781574981889


ISBN 10:   1574981889
Pages:   428
Publication Date:   16 March 2006
Audience:   Professional and scholarly ,  Professional & Vocational
Format:   Paperback
Publisher's Status:   Active
Availability:   Out of stock   Availability explained
The supplier is temporarily out of stock of this item. It will be ordered for you on backorder and shipped when it becomes available.

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K. M. Nair is the editor of Developments in Dielectric Materials and Electronic Devices: Proceedings of the 106th Annual Meeting of The American Ceramic Society, Indianapolis, Indiana, USA 2004, published by Wiley. Ruyan Guo is an electrical engineer and the Robert E. Clarke Endowed Professor at the University of Texas, San Antonio. Guo was named a Fellow of the Institute of Electrical and Electronics Engineers in 2013 for his contributions to the understanding of polarization phenomena in ferroelectric solid-solution systems.

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