Development of Methods for Characterisation of Roughness in Three Dimensions

Author:   Ken J Stout ,  Liam Blunt (Taylor Hobson Professor of Surface Metrology at the University of Huddersfield, UK) ,  W. P. Dong ,  E. Mainsah
Publisher:   Elsevier Science & Technology
Edition:   2nd Revised edition
ISBN:  

9781857180237


Pages:   384
Publication Date:   01 June 2002
Format:   Paperback
Availability:   Out of stock   Availability explained
The supplier is temporarily out of stock of this item. It will be ordered for you on backorder and shipped when it becomes available.

Our Price $217.95 Quantity:  
Add to Cart

Share |

Development of Methods for Characterisation of Roughness in Three Dimensions


Add your own review!

Overview

Based on research funded by the European Commission, this important handbook provides a basis for a unified approach to three-dimensional surface finish assessment. It covers a broad range of issues related to 3-D micro-topography, with particular emphasis on standardisation, measurement, characterisation and interpretation. This reprint includes an updating introductory section. This work is to be the basis for a 3D international standard.

Full Product Details

Author:   Ken J Stout ,  Liam Blunt (Taylor Hobson Professor of Surface Metrology at the University of Huddersfield, UK) ,  W. P. Dong ,  E. Mainsah
Publisher:   Elsevier Science & Technology
Imprint:   Penton Press
Edition:   2nd Revised edition
Dimensions:   Width: 21.00cm , Height: 2.30cm , Length: 29.70cm
Weight:   1.010kg
ISBN:  

9781857180237


ISBN 10:   1857180232
Pages:   384
Publication Date:   01 June 2002
Audience:   Professional and scholarly ,  Professional & Vocational
Format:   Paperback
Publisher's Status:   Active
Availability:   Out of stock   Availability explained
The supplier is temporarily out of stock of this item. It will be ordered for you on backorder and shipped when it becomes available.

Table of Contents

1. Updating introduction to this revised reprint; 2. An integrated approach to the assessment of 3-D micro-topography; 3. Techniques and fidelity of data collection; 4. Measurement strategy of the stylus instrument; 5. Effects of stylus geometry and loading; 6. Fidelity of the measurement datum; 7. The selection of sampling conditions; 8. Specification for a unified data file format; 9. Reference for 3-D topography characterisation; 10. Digital filtering of 3-D surface topography; 11. Characterisation techniques; 12. Parameters for characterising 3-D surfaces; 13. The effects of quantisation on 3-D topography characterisation; 14. Functional characterisation of engineering surfaces ; 15. Calibration of surface topography instruments.

Reviews

Author Information

Professor Liam Blunt is Taylor Hobson Professor of Surface Metrology at the University of Huddersfield, UK. He is author of numerous published papers and other contributions on surface technology, and is co-author with Ken Stout of Three Dimensional Surface Topography (published by Penton Press, 2000).

Tab Content 6

Author Website:  

Customer Reviews

Recent Reviews

No review item found!

Add your own review!

Countries Available

All regions
Latest Reading Guide

MRG2025CC

 

Shopping Cart
Your cart is empty
Shopping cart
Mailing List