Design, Analysis and Test of Logic Circuits Under Uncertainty
Publisher:   Springer
ISBN:  

9781283640770


Pages:   130
Publication Date:   01 January 2013
Format:   Undefined
Availability:   Available To Order   Availability explained
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Design, Analysis and Test of Logic Circuits Under Uncertainty


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Overview

Logic circuits are becoming increasingly susceptible to probabilistic behavior caused by external radiation and process variation. In addition, inherently probabilistic quantum- and nano-technologies are on the horizon as we approach the limits of CMOS scaling. Ensuring the reliability of such circuits despite the probabilistic behavior is a key challenge in IC design---one that necessitates a fundamental, probabilistic reformulation of synthesis and testing techniques. This monograph will present techniques for analyzing, designing, and testing logic circuits with probabilistic behavior.

Full Product Details

Publisher:   Springer
Imprint:   Springer
ISBN:  

9781283640770


ISBN 10:   1283640775
Pages:   130
Publication Date:   01 January 2013
Audience:   General/trade ,  General
Format:   Undefined
Publisher's Status:   Active
Availability:   Available To Order   Availability explained
We have confirmation that this item is in stock with the supplier. It will be ordered in for you and dispatched immediately.

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