Deposition and Characterization of Thin Films
Author:   GOULD
Publisher:   Chapman and Hall
ISBN:  

9780412274305


Pages:   275
Publication Date:   01 March 1995
Format:   Paperback
Availability:   In Print   Availability explained
This item will be ordered in for you from one of our suppliers. Upon receipt, we will promptly dispatch it out to you. For in store availability, please contact us.

Our Price $73.95 Quantity:  
Add to Cart

Share |

Deposition and Characterization of Thin Films


Overview

Full Product Details

Author:   GOULD
Publisher:   Chapman and Hall
Imprint:   Chapman and Hall
ISBN:  

9780412274305


ISBN 10:   0412274302
Pages:   275
Publication Date:   01 March 1995
Audience:   Professional and scholarly ,  Professional & Vocational
Format:   Paperback
Publisher's Status:   Active
Availability:   In Print   Availability explained
This item will be ordered in for you from one of our suppliers. Upon receipt, we will promptly dispatch it out to you. For in store availability, please contact us.

Table of Contents

Reviews

Author Information

Tab Content 6

Author Website:  

Countries Available

All regions
Latest Reading Guide

NOV RG 20252

 

Shopping Cart
Your cart is empty
 Shopping cart
Mailing List

 

Sign up now