Deep Learning and XAI Techniques for Anomaly Detection: Integrate the theory and practice of deep anomaly explainability

Author:   Cher Simon ,  Jeff Barr
Publisher:   Packt Publishing Limited
ISBN:  

9781804617755


Pages:   218
Publication Date:   31 January 2023
Format:   Paperback
Availability:   In stock   Availability explained
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Deep Learning and XAI Techniques for Anomaly Detection: Integrate the theory and practice of deep anomaly explainability


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Author:   Cher Simon ,  Jeff Barr
Publisher:   Packt Publishing Limited
Imprint:   Packt Publishing Limited
ISBN:  

9781804617755


ISBN 10:   180461775
Pages:   218
Publication Date:   31 January 2023
Audience:   General/trade ,  General
Format:   Paperback
Publisher's Status:   Active
Availability:   In stock   Availability explained
We have confirmation that this item is in stock with the supplier. It will be ordered in for you and dispatched immediately.

Table of Contents

Table of Contents Understanding Deep Learning Anomaly Detection Understanding Explainable AI Natural Language Processing Anomaly Explainability Time Series Anomaly Explainability Computer Vision Anomaly Explainability Differentiating Intrinsic versus Post Hoc Explainability Backpropagation Versus Perturbation Explainability Model-Agnostic versus Model-Specific Explainability Explainability Evaluation Schemes

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Author Information

Cher Simon is a principal solutions architect specializing in artificial intelligence, machine learning, and data analytics at AWS. Cher has 20 years of experience in architecting enterprise-scale, data-driven, and AI-powered industry solutions. Besides building cloud-native solutions in her day-to-day role with customers, Cher is also an avid writer and a frequent speaker at AWS conferences.

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