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OverviewData Quality: The Accuracy Dimension is about assessing the quality of corporate data and improving its accuracy using the data profiling method. Corporate data is increasingly important as companies continue to find new ways to use it. Likewise, improving the accuracy of data in information systems is fast becoming a major goal as companies realize how much it affects their bottom line. Data profiling is a new technology that supports and enhances the accuracy of databases throughout major IT shops. Jack Olson explains data profiling and shows how it fits into the larger picture of data quality. Full Product DetailsAuthor: Jack E. Olson (Chief Technology Officer, NEON Enterprise Software)Publisher: Elsevier Science & Technology Imprint: Morgan Kaufmann Publishers In Dimensions: Width: 15.20cm , Height: 1.60cm , Length: 22.90cm Weight: 0.390kg ISBN: 9781558608917ISBN 10: 1558608915 Pages: 312 Publication Date: 09 January 2003 Audience: Professional and scholarly , Professional & Vocational Format: Paperback Publisher's Status: Active Availability: In Print This item will be ordered in for you from one of our suppliers. Upon receipt, we will promptly dispatch it out to you. For in store availability, please contact us. Table of ContentsReviewsJack Olson's contribution represents the superb blend of theory and guidance from amaster practitioner. - Peter Aiken Jack Olson's contribution represents the superb blend of theory and guidance from a master practitioner. --Peter Aiken Jack Olson's contribution represents the superb blend of theory and guidance from a master practitioner. - Peter Aiken Jack Olson's contribution represents the superb blend of theory and guidance from a master practitioner. - Peter Aiken ""Jack Olson's contribution represents the superb blend of theory and guidance from a master practitioner."" --Peter Aiken Author InformationJack E. Olson is a widely recognized database technology expert. His career includes significant contributions at IBM, BMC, Evoke, and now NEON Enterprise Software, where he serves as Chief Technology Office. Olson is author of Data Quality: The Accuracy Dimension, also published by Morgan Kaufmann. The inventor of record on several patents, he holds a BS from the Illinois Institute of Technology and an MBA from Northwestern University. Tab Content 6Author Website:Countries AvailableAll regions |
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