Data-driven Methods for Fault Detection and Diagnosis in Chemical Processes
Author:   Evan L. Russell ,  Leo H. Chiang ,  Richard D. Braatz
Publisher:   Springer London Ltd
Edition:   Softcover reprint of the original 1st ed. 2000
ISBN:  

9781852332587


Pages:   192
Publication Date:   25 February 2000
Format:   Paperback
Availability:   In Print   Availability explained
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Data-driven Methods for Fault Detection and Diagnosis in Chemical Processes


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Author:   Evan L. Russell ,  Leo H. Chiang ,  Richard D. Braatz
Publisher:   Springer London Ltd
Imprint:   Springer London Ltd
Edition:   Softcover reprint of the original 1st ed. 2000
Dimensions:   Width: 15.50cm , Height: 1.20cm , Length: 23.50cm
Weight:   1.050kg
ISBN:  

9781852332587


ISBN 10:   1852332581
Pages:   192
Publication Date:   25 February 2000
Audience:   College/higher education ,  Professional and scholarly ,  Undergraduate ,  Postgraduate, Research & Scholarly
Format:   Paperback
Publisher's Status:   Active
Availability:   In Print   Availability explained
This item will be ordered in for you from one of our suppliers. Upon receipt, we will promptly dispatch it out to you. For in store availability, please contact us.

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