Data-Driven Fault Detection for Industrial Processes: Canonical Correlation Analysis and Projection Based Methods
Author:   Zhiwen Chen
Publisher:   Springer Fachmedien Wiesbaden
Edition:   1st ed. 2017
ISBN:  

9783658167554


Pages:   112
Publication Date:   09 January 2017
Format:   Paperback
Availability:   Manufactured on demand   Availability explained
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Data-Driven Fault Detection for Industrial Processes: Canonical Correlation Analysis and Projection Based Methods


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Full Product Details

Author:   Zhiwen Chen
Publisher:   Springer Fachmedien Wiesbaden
Imprint:   Springer Vieweg
Edition:   1st ed. 2017
Dimensions:   Width: 14.80cm , Height: 0.70cm , Length: 21.00cm
Weight:   1.806kg
ISBN:  

9783658167554


ISBN 10:   3658167556
Pages:   112
Publication Date:   09 January 2017
Audience:   Professional and scholarly ,  Professional & Vocational
Format:   Paperback
Publisher's Status:   Active
Availability:   Manufactured on demand   Availability explained
We will order this item for you from a manufactured on demand supplier.

Table of Contents

A New Index for Performance Evaluation of FD Methods.- CCA-based FD Method for the Monitoring of Stationary Processes.- Projection-based FD Method for the Monitoring of Dynamic Processes.- Benchmark Study and Real-Time Implementation.  

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Author Information

Zhiwen Chen’s research interests include multivariate statistical process monitoring, model-based and data-driven fault diagnosis as well as their application to industrial processes. He is currently working at the School of Information Science and Engineering at Central South University, China.

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