Crystallographic Instrumentation
Author:   L. A Aslanov (Professor, Department of Chemistry, Professor, Department of Chemistry) ,  G. V. Fetisov (Department of Chemistry, Department of Chemistry, both at the Moscow State University) ,  J. A. K. Howard (Professor, Department of Chemistry, Professor, Department of Chemistry, University of Durham)
Publisher:   Oxford University Press
Volume:   7
ISBN:  

9780198559276


Pages:   328
Publication Date:   30 April 1998
Format:   Hardback
Availability:   To order   Availability explained
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Crystallographic Instrumentation


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Overview

This text provides an up-to-date overview of crystallographic instrumentation and methods of diffraction measurements used for crystal and molecular structure determination. The book provides a unique description of both principles and specific instruments, and methods for data collection, adjustment of instruments, and primary data processing and error correction.

Full Product Details

Author:   L. A Aslanov (Professor, Department of Chemistry, Professor, Department of Chemistry) ,  G. V. Fetisov (Department of Chemistry, Department of Chemistry, both at the Moscow State University) ,  J. A. K. Howard (Professor, Department of Chemistry, Professor, Department of Chemistry, University of Durham)
Publisher:   Oxford University Press
Imprint:   Oxford University Press
Volume:   7
Dimensions:   Width: 16.10cm , Height: 2.20cm , Length: 24.20cm
Weight:   0.641kg
ISBN:  

9780198559276


ISBN 10:   0198559275
Pages:   328
Publication Date:   30 April 1998
Audience:   Professional and scholarly ,  Professional & Vocational
Format:   Hardback
Publisher's Status:   Active
Availability:   To order   Availability explained
Stock availability from the supplier is unknown. We will order it for you and ship this item to you once it is received by us.

Table of Contents

1: Radiation used in Crystallography 2: Principle of the Diffraction Experiment 3: Fundamental Techniques for X-ray Diffractometry 4: Single-crystal X-ray Diffractometry 5: Single Crystal Diffraction Data Collection and primary Procesing 6: Primary Data Reduction and Error Correction in Single-Crystal Diffractometry 7: Defects in Crystals and their Influence on X-ray Structure Analysis 8: Auxiliary Methods References Subject Index

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