Crustal Structure and Deep Deformation of the Chinese Mainland: Evidence from Deep Seismic Reflection Profiles and Other Geophysical Data Sets

Author:   Rui Gao (Academician, Chinese Academy of Sciences; Director, Laboratory of Earthprobe and Geodynamics, Ministry of Land and Resources, China)
Publisher:   Elsevier Science Publishing Co Inc
ISBN:  

9780128135594


Pages:   400
Publication Date:   01 July 2022
Format:   Paperback
Availability:   In Print   Availability explained
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Crustal Structure and Deep Deformation of the Chinese Mainland: Evidence from Deep Seismic Reflection Profiles and Other Geophysical Data Sets


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Author:   Rui Gao (Academician, Chinese Academy of Sciences; Director, Laboratory of Earthprobe and Geodynamics, Ministry of Land and Resources, China)
Publisher:   Elsevier Science Publishing Co Inc
Imprint:   Elsevier Science Publishing Co Inc
ISBN:  

9780128135594


ISBN 10:   012813559
Pages:   400
Publication Date:   01 July 2022
Audience:   Professional and scholarly ,  Professional & Vocational
Format:   Paperback
Publisher's Status:   Active
Availability:   In Print   Availability explained
This item will be ordered in for you from one of our suppliers. Upon receipt, we will promptly dispatch it out to you. For in store availability, please contact us.

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Prof. Gao has led thousands kilometres-long deep seismic reflection experiment. The results have contributed greatly to understanding tectonic evolution of the Chinese mainland and Neotectonics of the Tibetan Plateau. He is a Professor of Geophysics for the Chinese Academy of Geological Sciences and Sun Yat-Sen University. He has also served as an Engineer for the Ministry of Geology and Mineral Resources of China and has written numerous articles and chapters for publications on the topic. He was elected as an Academician of Chinese Academy of Sciences in Geology Department in 2015. Throughout his career, he has been focusing on integrating geology and geophysics to understand tectonics.

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