Critical Phenomena at Surfaces and Interfaces: Evanescent X-ray and Neutron Scattering
Author:   Helmut Dosch
Publisher:   Springer-Verlag Berlin and Heidelberg GmbH & Co. KG
Volume:   v. 126
ISBN:  

9783540545347


Pages:   159
Publication Date:   25 May 1992
Format:   Hardback
Availability:   Out of stock   Availability explained
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Critical Phenomena at Surfaces and Interfaces: Evanescent X-ray and Neutron Scattering


Overview

Much progress has been made in the understanding of critical phenomena at surfaces and interfaces as a result of the novel experimental technique of grazing angle x-ray and neuron scattering, and theoretical concepts and predictions such as surface-induced order and disorder. This volume treats the scattering of evanascent x-ray and neutron waves inside a solid. Particular emphasis is put on the use of this technique to extract microscopic information from the real structure of a surface, from buried and magnetic interfaces and from surface roughness.

Full Product Details

Author:   Helmut Dosch
Publisher:   Springer-Verlag Berlin and Heidelberg GmbH & Co. KG
Imprint:   Springer-Verlag Berlin and Heidelberg GmbH & Co. K
Volume:   v. 126
Weight:   0.370kg
ISBN:  

9783540545347


ISBN 10:   3540545344
Pages:   159
Publication Date:   25 May 1992
Audience:   Professional and scholarly ,  Professional & Vocational
Format:   Hardback
Publisher's Status:   Active
Availability:   Out of stock   Availability explained
The supplier is temporarily out of stock of this item. It will be ordered for you on backorder and shipped when it becomes available.

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