Credit Risk Measurement: New Approaches to Value-at-Risk and Other Paradigms

Author:   Anthony Saunders
Publisher:   John Wiley & Sons Inc
ISBN:  

9780471350842


Pages:   240
Publication Date:   15 July 1999
Format:   Hardback
Availability:   Out of stock   Availability explained
The supplier is temporarily out of stock of this item. It will be ordered for you on backorder and shipped when it becomes available.

Our Price $115.95 Quantity:  
Add to Cart

Share |

Credit Risk Measurement: New Approaches to Value-at-Risk and Other Paradigms


Add your own review!

Overview

Full Product Details

Author:   Anthony Saunders
Publisher:   John Wiley & Sons Inc
Imprint:   John Wiley & Sons Inc
Dimensions:   Width: 16.20cm , Height: 2.20cm , Length: 24.00cm
Weight:   0.499kg
ISBN:  

9780471350842


ISBN 10:   0471350842
Pages:   240
Publication Date:   15 July 1999
Audience:   Professional and scholarly ,  Professional & Vocational
Format:   Hardback
Publisher's Status:   Active
Availability:   Out of stock   Availability explained
The supplier is temporarily out of stock of this item. It will be ordered for you on backorder and shipped when it becomes available.

Table of Contents

Reviews

Author Information

ANTHONY SAUNDERS is the John M. Schiff Professor of Finance and Chair of the Department of Finance at the Stern School of Business at New York University. He holds positions on the Board of Academic Consultants of the Federal Reserve Board of Governors and the Council of Research Advisors for the Federal National Mortgage Association. He is the Editor of the Journal of Banking and Finance and the Journal of Financial Markets, Instruments, and Institutions.

Tab Content 6

Author Website:  

Customer Reviews

Recent Reviews

No review item found!

Add your own review!

Countries Available

All regions
Latest Reading Guide

wl

Shopping Cart
Your cart is empty
Shopping cart
Mailing List