Computer Vision Metrics: Survey, Taxonomy, and Analysis

Author:   Scott Krig
Publisher:   Springer International Publishing AG
Edition:   2nd 2016 ed.
ISBN:  

9783319308999


Pages:   740
Publication Date:   07 July 2016
Format:   Hardback
Availability:   Not yet available   Availability explained
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Computer Vision Metrics: Survey, Taxonomy, and Analysis


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Author:   Scott Krig
Publisher:   Springer International Publishing AG
Imprint:   Springer International Publishing AG
Edition:   2nd 2016 ed.
ISBN:  

9783319308999


ISBN 10:   3319308998
Pages:   740
Publication Date:   07 July 2016
Audience:   College/higher education ,  Professional and scholarly ,  Postgraduate, Research & Scholarly ,  Professional & Vocational
Format:   Hardback
Publisher's Status:   Active
Availability:   Not yet available   Availability explained
This item is yet to be released. You can pre-order this item and we will dispatch it to you upon its release.

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Scott Krig is a pioneer in computer imaging, computer vision, and graphics visualization. He founded Krig Research in 1988, providing the world's first image and vision systems based on high-performance engineering workstations, super-computers, and dedicated imaging hardware, serving customers worldwide in 25 countries. Scott has provided imaging and vision solutions around the globe, and has worked closely with many industries including aerospace, military, intelligence, law enforcement, government research, and academic organizations. More recently, Scott has worked for major corporations and startups serving commercial markets, solving problems in the areas of computer vision, imaging, graphics, visualization, robotics, process control, industrial automation, computer security, cryptography, and consumer applications of imaging and machine vision to PCs, laptops, mobile phones, and tablets. Most recently, Scott provided direction for Intel Corporation in the area of depth-sensing and computer vision methods for embedded systems and mobile platforms. Scott is the author of many patent applications worldwide in the areas of embedded systems, imaging, computer vision, DRM, and computer security, and studied at Stanford.

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