Compressed Sensing in Radar Signal Processing

Author:   Antonio De Maio (Università degli Studi di Napoli 'Federico II') ,  Yonina C. Eldar (Weizmann Institute of Science, Israel) ,  Alexander M. Haimovich (New Jersey Institute of Technology)
Publisher:   Cambridge University Press
ISBN:  

9781108428293


Pages:   378
Publication Date:   17 October 2019
Format:   Hardback
Availability:   Available To Order   Availability explained
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Compressed Sensing in Radar Signal Processing


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Author:   Antonio De Maio (Università degli Studi di Napoli 'Federico II') ,  Yonina C. Eldar (Weizmann Institute of Science, Israel) ,  Alexander M. Haimovich (New Jersey Institute of Technology)
Publisher:   Cambridge University Press
Imprint:   Cambridge University Press
Dimensions:   Width: 17.80cm , Height: 2.10cm , Length: 25.30cm
Weight:   0.890kg
ISBN:  

9781108428293


ISBN 10:   1108428290
Pages:   378
Publication Date:   17 October 2019
Audience:   Professional and scholarly ,  Professional & Vocational
Format:   Hardback
Publisher's Status:   Active
Availability:   Available To Order   Availability explained
We have confirmation that this item is in stock with the supplier. It will be ordered in for you and dispatched immediately.

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Antonio De Maio is a Professor in the Department of Electrical Engineering and Information Technology at the Università degli Studi di Napoli Federico II, and a Fellow of the Institute of Electrical and Electronics Engineers (IEEE). Yonina C. Eldar is a Professor at the Weizmann Institute of Science. She has authored and edited several books, including Sampling Theory: Beyond Bandlimited Systems (Cambridge, 2015) and Compressed Sensing: Theory and Applications (Cambridge, 2012). She is a Fellow of the Institute of Electrical and Electronics Engineers (IEEE) and Eurasip, and a member of the Israel National Academy of Science and Humanities. Alexander M. Haimovich is a Distinguished Professor in the Department of Electrical and Computer Engineering at the New Jersey Institute of Technology, and a Fellow of the Institute of Electrical and Electronics Engineers (IEEE).

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