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OverviewExtreme ultraviolet radiation (X-UV), also referred to as soft X-rays, offers very special optical properties. The X-UV refractive index of matter is such that normal reflection cannot take place on polished surfaces whereas beam transmission through one micrometer of almost all materials reduces to zero. Therefore, it has long been a difficult task to imagine and to implement devices designed for optical experiments in this wavelength range. After soft x-ray holography became available the use of X-UV radiation for interferometry, holography, diffractive optics, nonlinear radiation-matter interaction, time-resolved study of fast phenomena and many other applications, including medical sciences, is ubiquitous. Full Product DetailsAuthor: Pierre JaegléPublisher: Springer-Verlag New York Inc. Imprint: Springer-Verlag New York Inc. Edition: 2006 ed. Volume: 106 Dimensions: Width: 15.50cm , Height: 2.30cm , Length: 23.50cm Weight: 0.811kg ISBN: 9780387230078ISBN 10: 0387230076 Pages: 416 Publication Date: 06 December 2005 Audience: Professional and scholarly , Professional & Vocational Format: Hardback Publisher's Status: Active Availability: Out of stock The supplier is temporarily out of stock of this item. It will be ordered for you on backorder and shipped when it becomes available. Table of ContentsReviewsAuthor InformationTab Content 6Author Website:Countries AvailableAll regions |
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