CMOS RF Circuit Design for Reliability and Variability
Author:   Jiann-Shiun Yuan
Publisher:   Springer Verlag, Singapore
Edition:   1st ed. 2016
ISBN:  

9789811008825


Pages:   106
Publication Date:   21 April 2016
Format:   Paperback
Availability:   Manufactured on demand   Availability explained
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CMOS RF Circuit Design for Reliability and Variability


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Overview

The subject of this book is CMOS RF circuit design for reliability. The device reliability and process variation issues on RF transmitter and receiver circuits will be particular interest to the readers in the field of semiconductor devices and circuits. This proposed book is unique to explore typical reliability issues in the device and technology level and then to examine their impact on RF wireless transceiver circuit performance. Analytical equations, experimental data, device and circuit simulation results will be given for clear explanation. The main benefit the reader derive from this book will be clear understanding on how device reliability issues affects the RF circuit performance subjected to operation aging and process variations.

Full Product Details

Author:   Jiann-Shiun Yuan
Publisher:   Springer Verlag, Singapore
Imprint:   Springer Verlag, Singapore
Edition:   1st ed. 2016
Dimensions:   Width: 15.50cm , Height: 0.60cm , Length: 23.50cm
Weight:   1.825kg
ISBN:  

9789811008825


ISBN 10:   9811008825
Pages:   106
Publication Date:   21 April 2016
Audience:   Professional and scholarly ,  Professional & Vocational
Format:   Paperback
Publisher's Status:   Active
Availability:   Manufactured on demand   Availability explained
We will order this item for you from a manufactured on demand supplier.

Table of Contents

CMOS Transistor Reliability and Variability.- Wireless Receiver and Transmitter Circuit Reliability.- Low Noise Amplifier Reliability and Variability.- Power Amplifier Reliability and Variability.- Voltage Controlled Oscillator Reliability and Variability.- Mixer Reliability.

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