CMOS Gate-Stack Scaling — Materials, Interfaces and Reliability Implications: Volume 1155
Author:   Alexander A. Demkov (University of Texas, Austin) ,  Bill Taylor ,  H. Rusty Harris (Texas A & M University) ,  Jeffery W. Butterbaugh
Publisher:   Cambridge University Press
ISBN:  

9781107408326


Pages:   194
Publication Date:   05 June 2014
Format:   Paperback
Availability:   Manufactured on demand   Availability explained
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CMOS Gate-Stack Scaling — Materials, Interfaces and Reliability Implications: Volume 1155


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Author:   Alexander A. Demkov (University of Texas, Austin) ,  Bill Taylor ,  H. Rusty Harris (Texas A & M University) ,  Jeffery W. Butterbaugh
Publisher:   Cambridge University Press
Imprint:   Cambridge University Press
Dimensions:   Width: 15.20cm , Height: 1.00cm , Length: 22.90cm
Weight:   0.270kg
ISBN:  

9781107408326


ISBN 10:   1107408326
Pages:   194
Publication Date:   05 June 2014
Audience:   College/higher education ,  Professional and scholarly ,  Postgraduate, Research & Scholarly ,  Professional & Vocational
Format:   Paperback
Publisher's Status:   Active
Availability:   Manufactured on demand   Availability explained
We will order this item for you from a manufactured on demand supplier.

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